Third Annual VOICE 2008, Verigy's Test System Users and Partners Conference, Draws Nearly 300 from Semiconductor Industry

Verigy (NASDAQ:VRGY), a premier semiconductor test company, held VOICE 2008, the company's third annual V93000 and V5000 Series Users and Partners Conference Sept. 23 and 24 in San Jose, Calif. The event was attended by almost 300 test engineers and managers from around the world, representing nearly 60 companies, including the top foundries, fabless semiconductor companies and independent device manufacturers (IDMs), as well as Verigy's partners. This group of thought leaders from the semiconductor test industry gathered to exchange information with their peers on the latest test techniques and best practices.

"Judging from attendance, participation and the formal and anecdotal feedback we’ve been getting, VOICE 2008 was our best conference yet,” said Debbora Ahlgren, vice president and chief marketing officer, Verigy. "It is exciting to see the growth of this annual event and the value it brings to our customers, who truly are the key to its success.”

Sixty-four technical presentations were given by Verigy customer, partner and employee experts along the conference's six track themes: Productivity Software and Tools, Communications and RF, High Speed and Memory Test Solutions, DC and Mixed Signal, High-Speed Digital and Test Techniques and Methodologies. The presentations were selected from the more than 120 abstracts submitted; submissions have increased 70 percent each year since the inaugural event in 2006. Twelve roundtables held at VOICE provided an opportunity for attendees to participate in information-sharing panel discussions with Verigy experts on a range of technical topics on semiconductor test.

This year, attendees also had the opportunity to visit kiosks where they could meet one-on-one with Verigy’s R&D management to discuss the newest software releases.

The event's keynote panel discussion on the challenges of meeting rising industry expectations for time-to-market, time-to-volume, time-to-yield, was led by Dan Hutcheson, CEO of VLSI Research. Insights from different perspectives were offered by Sanjiv Taneja of Cadence, Raymond Lee of NANO ISI, Scott Gatzemeier of IMFT, Octavio Martinez of Qualcomm and John Chen of nVidia. A keynote presentation on the "state of the industry” given by Bill McClean of IC Insights was well received by attendees. In addition, VOICE 2008 featured a popular Suppliers Expo with representatives from 21 Verigy partner companies available to provide information to Verigy customers.

For those who were unable to attend, VOICE 2008 Verigy is offering a CD of the proceedings for $50 which includes the papers presented. To order, visit: www.verigy.com/go/VOICE2008.

VOICE is managed by a steering committee of volunteer representatives from Verigy and its customers. Early planning for the next VOICE event is already underway. The VOICE steering committee will be formally announced in early Spring 2009.

About Verigy

Verigy designs, develops, manufactures, sells and services advanced semiconductor test systems and solutions for the flash memory, high-speed memory and system-on-chip (SoC) markets. Verigy’s scalable platforms are used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Advanced analysis tools accelerate design debug and yield ramp processes for Verigy’s customers. Information about Verigy can be found at www.verigy.com.