Veeco Announces the 5th Annual International Nanoscience Conference

Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, announced on-line registration for the "Seeing at the Nanoscale V” conference to be held at the University of California, Santa Barbara (UCSB), June 24-27, 2007. Celebrating its fifth year, the conference provides an optimum setting for scientists to share information on a wide variety of cutting-edge nanotechnology topics. Angela Belcher from Massachusetts Institute of Technology, MA, and David Awschalom, UCSB, will be this year’s keynote speakers. Conference information and registration can be found at www.veeco.com/nanoconference. "Seeing at the Nanoscale continues to be an outstanding international scientific forum for those involved in nanoscience from both academia and industry,” said Evelyn Hu, event advisor and department head for the California NanoSystems Institute at UCSB. "Nanostructural imaging, characterization, and modification utilizing scanning probe microscopy are revolutionizing scientific research, and this is the conference to attend to examine the findings and learn more about the future of nanoscience.” The three-day conference themed, "Exploring the Future of Nanotechnology,” provides both a platform and a tremendous opportunity for scientists worldwide to discuss their latest discoveries, and to share their research on next-generation nanotechnology with their peers and visionaries in the field of nanoscience. Each year the conference hosts several hundred international researchers and scientists. Conference sessions for 2007 include: Session 1: Extending the Limits of Scanning Probe Microscopy. Chair: Franz Giessibl, University of Regensburg, Germany. Guest Speaker: Flemming Besenbacher, University of Aarhus, Denmark Session 2: From Single Biomolecules to Cells. Chair: Darlo Anselmetti, Bielefeld University, Germany. Guest Speaker: Andreas Engel, Mueller Institute, Switzerland Session 3: Next Generation Materials and Polymer Systems. Chair: Dimitri Ivanov, Institute of Chemistry of Surfaces and Interfaces, Mulhouse, France. Guest Speaker: Martin Moeller, German Wool Institute/Technical University of Aachen, Germany Session 4: Beyond Topography: Measurement of Physical Properties at the Nanoscale. Chair: Dawn Bonnell, University of Pennsylvania, USA. Guest Speakers: Kumar Wickramasinghe, IBM Almaden Research Center, San Jose, USA, and Zhongfan Liu, Peking University, Beijing, China. Session 5: Instruments and Probes: New Tools and Techniques for Nanoscience. Chair: Craig Prater, Veeco Instruments, Santa Barbara, CA, USA. Guest Speaker: Masamichi Fujihira, Tokyo Institute of Technology, Japan The event is co-sponsored by Veeco and California NanoSystems Institute at UCSB. Additional information can be found at http://www.veeco.com/nanoconference. About Veeco Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide, data storage, HB-LED/wireless, semiconductor and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/. To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risk factors discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2006. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.